Direct structure inversion from exit waves. Part II: A practical example

A. Wang; F.R. Chen; S. Van Aert; D. Van Dyck

doi:10.1016/j.ultramic.2012.03.011

Direct structure inversion from exit waves. Part II : A practical example

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Overview

14 Scopus Citations

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Author(s)

A. Wang
F.R. Chen
S. Van Aert
D. Van Dyck

Detail(s)

Original language	English
Pages (from-to)	77-85
Journal / Publication	Ultramicroscopy
Volume	116
Online published	28 Mar 2012
Publication status	Published - May 2012
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1016/j.ultramic.2012.03.011 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84861512164&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(7e9d432c-dff6-4904-adcc-81696cb48a93).html

Abstract

This paper is the second part of a two-part paper on direct structure inversion from exit waves. In the first part, a method has been proposed to quantitatively determine structure parameters with atomic resolution such as atom column positions, surface profile and the number of atoms in the atom columns. In this part, the theory will be demonstrated by means of a Au[110] exit wave reconstructed from a set of focal-series images. The procedures to analyze the experimentally reconstructed exit wave in terms of quantitative structure information are described in detail.