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Direct observation of nanoscale dynamics of ferroelectric degradation

  • Qianwei Huang
  • , Zibin Chen*
  • , Matthew J. Cabral
  • , Feifei Wang
  • , Shujun Zhang
  • , Fei Li
  • , Yulan Li
  • , Simon P. Ringer
  • , Haosu Luo
  • , Yiu-Wing Mai
  • , Xiaozhou Liao*
  • *Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Abstract

Failure of polarization reversal, i.e., ferroelectric degradation, induced by cyclic electric loadings in ferroelectric materials, has been a long-standing challenge that negatively impacts the application of ferroelectrics in devices where reliability is critical. It is generally believed that space charges or injected charges dominate the ferroelectric degradation. However, the physics behind the phenomenon remains unclear. Here, using in-situ biasing transmission electron microscopy, we discover change of charge distribution in thin ferroelectrics during cyclic electric loadings. Charge accumulation at domain walls is the main reason of the formation of c domains, which are less responsive to the applied electric field. The rapid growth of the frozen c domains leads to the ferroelectric degradation. This finding gives insights into the nature of ferroelectric degradation in nanodevices, and reveals the role of the injected charges in polarization reversal. © 2021, The Author(s).
Original languageEnglish
Article number2095
JournalNature Communications
Volume12
Online published7 Apr 2021
DOIs
Publication statusPublished - 2021
Externally publishedYes

Funding

The authors acknowledge the facilities and the scientific and technical assistance of the Microscopy Australia node at the University of Sydney (Sydney Microscopy & Microanalysis). The authors also acknowledge the financial support from the Australian Research Council Discovery Project DP190101155.

Publisher's Copyright Statement

  • This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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