@inbook{846d8ba3fe374a53b4276b73d5bcca4c,
title = "Digital-based technology for fabric structure analysis",
abstract = "In this chapter, typical applications of image-based technologies used for the analysis of fabric structure and texture are summarized and discussed. Among them, a new digital method, based on the dual side scanning and active grid model (AGM), is introduced to demonstrate how to identify the weave pattern of woven fabrics. Some preliminary experiments and discussions are also included to validate this method. {\textcopyright} 2011 Woodhead Publishing Limited All rights reserved.",
keywords = "Active grid model, Dual side scanning, Fabric structure, Image analysis, Weave pattern",
author = "B. XIN and J. HU and G. BACIU and X. YU",
year = "2011",
month = jul,
day = "14",
doi = "10.1533/9780857093608.1.23",
language = "English",
isbn = "978-1-84569-729-7",
series = "Woodhead Publishing Series in Textiles",
publisher = "Woodhead Publishing",
number = "121",
pages = "23--44",
editor = "Jinlian Hu",
booktitle = "Computer technology for textiles and apparel",
}