Differentiation between tracks and damages in SSNTD under the atomic force microscope

J. P Y Ho; C. W Y Yip; D. Nikezic; K. N. Yu

doi:10.1016/S1350-4487(03)00114-8

Differentiation between tracks and damages in SSNTD under the atomic force microscope

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

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