Dielectric surface loss in superconducting resonators with flux-trapping holes

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

26 Scopus Citations
View graph of relations

Author(s)

  • B Chiaro
  • A Megrant
  • A Dunsworth
  • Z Chen
  • R Barends
  • B Campbell
  • Y Chen
  • A Fowler
  • E Jeffrey
  • J Kelly
  • J Mutus
  • C Neill
  • P J J O'Malley
  • C Quintana
  • P Roushan
  • D Sank
  • A Vainsencher
  • J Wenner
  • T C White
  • John M Martinis

Detail(s)

Original languageEnglish
Article number104006
Journal / PublicationSuperconductor Science and Technology
Volume29
Issue number10
Publication statusPublished - 19 Aug 2016
Externally publishedYes

Abstract

Surface distributions of two level system (TLS) defects and magnetic vortices are limiting dissipation sources in superconducting quantum circuits. Arrays of flux-trapping holes are commonly used to eliminate loss due to magnetic vortices, but may increase dielectric TLS loss. We find that dielectric TLS loss increases by approximately 25% for resonators with a hole array beginning 2 μm from the resonator edge, while the dielectric loss added by holes further away was below measurement sensitivity. Other forms of loss were not affected by the holes. Additionally, we estimate the loss due to residual magnetic effects to be 9 x10-10 μT-1 for resonators patterned with flux-traps and operated in magnetic fields up to 5 μT. This is orders of magnitude below the total loss of the best superconducting coplanar waveguide resonators.

Research Area(s)

  • quantum computing, resonator, superconducting qubit, surface loss, vortex

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Citation Format(s)

Dielectric surface loss in superconducting resonators with flux-trapping holes. / Chiaro, B; Megrant, A; Dunsworth, A et al.
In: Superconductor Science and Technology, Vol. 29, No. 10, 104006, 19.08.2016.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review