Dielectric surface loss in superconducting resonators with flux-trapping holes
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Article number | 104006 |
Journal / Publication | Superconductor Science and Technology |
Volume | 29 |
Issue number | 10 |
Publication status | Published - 19 Aug 2016 |
Externally published | Yes |
Link(s)
Abstract
Surface distributions of two level system (TLS) defects and magnetic vortices are limiting dissipation sources in superconducting quantum circuits. Arrays of flux-trapping holes are commonly used to eliminate loss due to magnetic vortices, but may increase dielectric TLS loss. We find that dielectric TLS loss increases by approximately 25% for resonators with a hole array beginning 2 μm from the resonator edge, while the dielectric loss added by holes further away was below measurement sensitivity. Other forms of loss were not affected by the holes. Additionally, we estimate the loss due to residual magnetic effects to be 9 x10-10 μT-1 for resonators patterned with flux-traps and operated in magnetic fields up to 5 μT. This is orders of magnitude below the total loss of the best superconducting coplanar waveguide resonators.
Research Area(s)
- quantum computing, resonator, superconducting qubit, surface loss, vortex
Bibliographic Note
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Citation Format(s)
Dielectric surface loss in superconducting resonators with flux-trapping holes. / Chiaro, B; Megrant, A; Dunsworth, A et al.
In: Superconductor Science and Technology, Vol. 29, No. 10, 104006, 19.08.2016.
In: Superconductor Science and Technology, Vol. 29, No. 10, 104006, 19.08.2016.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review