Dielectric loss of multilayer coupled microstrip line using SLR formulation

Single layer reduction (SLR) formulation use to compute dielectric loss of even-odd modes of a multilayer coupled microstrip line was presented. The complex line capacitance was determined to compute complex effective relative permittivity for the even and odd modes. The variation of dielectric losses with respect to frequency was also computed. The maximum deviation in the results was found to be 2%. Comparison of the results with spectral domain analysis (SDA) method suggested high accuracy of the proposed technique.