Dielectric Breakdown Characteristics and Interface Trapping of Hafnium Oxide Films
- N. Zhan
- , M. C. Poon
- , Hei Wong
- , K. L. Ng
- , C. W. Kok
- , V. Filip
Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review
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