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Development of lossy and near-lossless compression methods for wafer surface structure digital holograms

  • Hongbo Zhang
  • , Wenjing Zhou
  • , Donald Leber
  • , Zhijuan Hu
  • , Xin Yang
  • , Peter W.M. Tsang
  • , Ting-Chung Poon

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Lossy and near-lossless digital hologram compression methods are investigated to compress different complexities of wafer surface structures. In the lossy compression method, we apply row- and column-based uniform downsampling together with spline interpolation, whereas in the near-lossless compression method, we use wavelet local modulus maxima and spline interpolation. Results have shown that the lossy compression method is able to achieve a compression ratio of up to 100 for simpler wafer surface structures than that for complex surface structures. However, the near-lossless compression method is able to yield almost lossless compression even for complex wafer surface structures with a compression of about two. The proposed compression methods are computationally friendly for wafer surface structures as there is no time-consuming iterative computation involved.
Original languageEnglish
Article number41304
JournalJournal of Micro/Nanolithography, MEMS, and MOEMS
Volume14
Issue number4
DOIs
Publication statusPublished - 1 Oct 2015

Research Keywords

  • digital hologram
  • lossy and near-lossless compression methods
  • wafer surface structure

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