Determining thermal diffuse scattering of vanadium with x-ray transmission scattering

Yang Ding; Paul Chow; Ho-Kwang Mao; Yang Ren; Charles T. Prewitt

doi:10.1063/1.2170142

Determining thermal diffuse scattering of vanadium with x-ray transmission scattering

Yang Ding
, Paul Chow
, Ho-Kwang Mao
, Yang Ren
, Charles T. Prewitt

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

3 Citations (Scopus)

Abstract

In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. © 2006 American Institute of Physics.

Original language	English
Article number	061903
Journal	Applied Physics Letters
Volume	88
Issue number	6
DOIs	https://doi.org/10.1063/1.2170142
Publication status	Published - Feb 2006
Externally published	Yes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Access Output

10.1063/1.2170142

Other Access Options

Check CityUHK Library

Permanent Link

Right click to copy link

Cite this

@article{4d768244ce504f1580f18d161d79ba2d,

title = "Determining thermal diffuse scattering of vanadium with x-ray transmission scattering",

abstract = "In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. {\textcopyright} 2006 American Institute of Physics.",

author = "Yang Ding and Paul Chow and Ho-Kwang Mao and Yang Ren and Prewitt, \{Charles T.\}",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected]. ",

year = "2006",

month = feb,

doi = "10.1063/1.2170142",

language = "English",

volume = "88",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "6",

}

TY - JOUR

T1 - Determining thermal diffuse scattering of vanadium with x-ray transmission scattering

AU - Ding, Yang

AU - Chow, Paul

AU - Mao, Ho-Kwang

AU - Ren, Yang

AU - Prewitt, Charles T.

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 2006/2

Y1 - 2006/2

N2 - In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. © 2006 American Institute of Physics.

AB - In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. © 2006 American Institute of Physics.

UR - https://www.scopus.com/pages/publications/32444432484

UR - https://www.scopus.com/pages/publications/32444432484#tab=impact

U2 - 10.1063/1.2170142

DO - 10.1063/1.2170142

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 88

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 6

M1 - 061903

ER -

Determining thermal diffuse scattering of vanadium with x-ray transmission scattering

Abstract

Bibliographical note

Access Output

Other Access Options

Permanent Link

Other Files and Links

Fingerprint

Cite this