TY - JOUR
T1 - Determining thermal diffuse scattering of vanadium with x-ray transmission scattering
AU - Ding, Yang
AU - Chow, Paul
AU - Mao, Ho-Kwang
AU - Ren, Yang
AU - Prewitt, Charles T.
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2006/2
Y1 - 2006/2
N2 - In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. © 2006 American Institute of Physics.
AB - In this work, we have proposed a fitting model to evaluate thermal diffuse scattering in the case of high energy incident x ray with Laue transmission scattering, applicable in future studies on samples at high pressure in a diamond anvil cell. We show that the fitting model including a Voigt function and a lattice contribution can account for the measured data. Phonon dispersion curves extracted in this way are consistent with data collected previously by other methods. © 2006 American Institute of Physics.
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U2 - 10.1063/1.2170142
DO - 10.1063/1.2170142
M3 - RGC 21 - Publication in refereed journal
SN - 0003-6951
VL - 88
JO - Applied Physics Letters
JF - Applied Physics Letters
IS - 6
M1 - 061903
ER -