TY - JOUR
T1 - Determination of the crystallographic directions and planes of features and of the misorientations of crystals with high accuracy and internal estimation of errors
AU - Chen, Fu‐Rong
AU - King, A. H.
PY - 1987/5
Y1 - 1987/5
N2 - Techniques are given for maximizing the accuracy of crystallographic measurements in the transmission electron microscope. In particular, line directions, plane orientations, and crystal misorientations are treated, and for each case the methods of data collection, refinement, and error estimation are given. These methods represent generalizations of Ball's optimizing crystallographic technique (Ball: Philos. Mag. A44:1307–1317, 1981), and we also provide extensions to hexagonal lattice applications.
AB - Techniques are given for maximizing the accuracy of crystallographic measurements in the transmission electron microscope. In particular, line directions, plane orientations, and crystal misorientations are treated, and for each case the methods of data collection, refinement, and error estimation are given. These methods represent generalizations of Ball's optimizing crystallographic technique (Ball: Philos. Mag. A44:1307–1317, 1981), and we also provide extensions to hexagonal lattice applications.
KW - Goniometry
KW - Hexagonal lattices
KW - Misorientation
KW - Orientation
UR - http://www.scopus.com/inward/record.url?scp=84986431939&partnerID=8YFLogxK
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84986431939&origin=recordpage
U2 - 10.1002/jemt.1060060108
DO - 10.1002/jemt.1060060108
M3 - RGC 21 - Publication in refereed journal
SN - 0741-0581
VL - 6
SP - 55
EP - 61
JO - Journal of Electron Microscopy Technique
JF - Journal of Electron Microscopy Technique
IS - 1
ER -