Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence

Y. F. Mei; G. G. Siu; Ricky K.Y. Fu; K. W. Wong; Paul K. Chu; C. W. Lai; H. C. Ong

doi:10.1016/j.nimb.2005.05.005

Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence

Y. F. Mei
, G. G. Siu
, Ricky K.Y. Fu
, K. W. Wong
, Paul K. Chu
, C. W. Lai
, H. C. Ong

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

13 Citations (Scopus)

Abstract

Visible bands arising from N-related defects are investigated by dynamic cathodoluminescence (CL) and Gaussian deconvolution. The intensity of the red band increases while that of the ultraviolet (UV) band decreases. The intensity of the yellow band also decreases but only slightly as a function of the electron bombardment cycle. The CL behavior of N-doped ZnO after post-annealing in N₂ at high temperature reveals that the N-related defects cannot be easily compensated. The results also confirm the assignment of the N-related defects and are in agreement with the theoretical prediction about Zn-N bonding. Our data provide some clues to the mechanism of the conversion of ZnO into p-type by nitrogen doping. © 2005 Elsevier B.V. All rights reserved.

Original language	English
Pages (from-to)	307-311
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	237
Issue number	1-2
DOIs	https://doi.org/10.1016/j.nimb.2005.05.005
Publication status	Published - Aug 2005
Event	15th International Conference on Ion Implantation Technology (IIT 2004) - The Grand Hotel, Taipei, Taiwan, China Duration: 25 Oct 2004 → 29 Oct 2004

Research Keywords

Cathodoluminescence
Defects
Nitrogen doping
Zinc oxide

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10.1016/j.nimb.2005.05.005

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@article{b8ace39818e84b329636f77b6afcb988,

title = "Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence",

abstract = "Visible bands arising from N-related defects are investigated by dynamic cathodoluminescence (CL) and Gaussian deconvolution. The intensity of the red band increases while that of the ultraviolet (UV) band decreases. The intensity of the yellow band also decreases but only slightly as a function of the electron bombardment cycle. The CL behavior of N-doped ZnO after post-annealing in N2 at high temperature reveals that the N-related defects cannot be easily compensated. The results also confirm the assignment of the N-related defects and are in agreement with the theoretical prediction about Zn-N bonding. Our data provide some clues to the mechanism of the conversion of ZnO into p-type by nitrogen doping. {\textcopyright} 2005 Elsevier B.V. All rights reserved.",

keywords = "Cathodoluminescence, Defects, Nitrogen doping, Zinc oxide",

author = "Mei, \{Y. F.\} and Siu, \{G. G.\} and Fu, \{Ricky K.Y.\} and Wong, \{K. W.\} and Chu, \{Paul K.\} and Lai, \{C. W.\} and Ong, \{H. C.\}",

year = "2005",

month = aug,

doi = "10.1016/j.nimb.2005.05.005",

language = "English",

volume = "237",

pages = "307--311",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier B.V.",

number = "1-2",

note = "15th International Conference on Ion Implantation Technology (IIT 2004), IIT 2004 ; Conference date: 25-10-2004 Through 29-10-2004",

}

Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence. / Mei, Y. F.; Siu, G. G.; Fu, Ricky K.Y. et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 237, No. 1-2, 08.2005, p. 307-311.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

TY - JOUR

T1 - Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence

AU - Mei, Y. F.

AU - Siu, G. G.

AU - Fu, Ricky K.Y.

AU - Wong, K. W.

AU - Chu, Paul K.

AU - Lai, C. W.

AU - Ong, H. C.

PY - 2005/8

Y1 - 2005/8

N2 - Visible bands arising from N-related defects are investigated by dynamic cathodoluminescence (CL) and Gaussian deconvolution. The intensity of the red band increases while that of the ultraviolet (UV) band decreases. The intensity of the yellow band also decreases but only slightly as a function of the electron bombardment cycle. The CL behavior of N-doped ZnO after post-annealing in N2 at high temperature reveals that the N-related defects cannot be easily compensated. The results also confirm the assignment of the N-related defects and are in agreement with the theoretical prediction about Zn-N bonding. Our data provide some clues to the mechanism of the conversion of ZnO into p-type by nitrogen doping. © 2005 Elsevier B.V. All rights reserved.

AB - Visible bands arising from N-related defects are investigated by dynamic cathodoluminescence (CL) and Gaussian deconvolution. The intensity of the red band increases while that of the ultraviolet (UV) band decreases. The intensity of the yellow band also decreases but only slightly as a function of the electron bombardment cycle. The CL behavior of N-doped ZnO after post-annealing in N2 at high temperature reveals that the N-related defects cannot be easily compensated. The results also confirm the assignment of the N-related defects and are in agreement with the theoretical prediction about Zn-N bonding. Our data provide some clues to the mechanism of the conversion of ZnO into p-type by nitrogen doping. © 2005 Elsevier B.V. All rights reserved.

KW - Cathodoluminescence

KW - Defects

KW - Nitrogen doping

KW - Zinc oxide

UR - https://www.scopus.com/pages/publications/23644453442

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-23644453442&origin=recordpage

U2 - 10.1016/j.nimb.2005.05.005

DO - 10.1016/j.nimb.2005.05.005

M3 - RGC 21 - Publication in refereed journal

SN - 0168-583X

VL - 237

SP - 307

EP - 311

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

IS - 1-2

T2 - 15th International Conference on Ion Implantation Technology (IIT 2004)

Y2 - 25 October 2004 through 29 October 2004

ER -

Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence

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Research Keywords

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