Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices

Y. F. Lin, W. B. Jian, Z. Y. Wu, F. R. Chen, J. J. Kai, J. J. Lin

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

Cylindrical ZnO nanowires were synthesized to fabricate two-contact ZnO nanowire devices with the same separation distance between the two contact electrodes. Electrical properties including temperature dependence of resistance and I-V curves were recorded. According to distinct electrical behaviors and room-temperature resistance, ZnO nanowire devices can be categorized into three different types exhibiting either contact or intrinsic NW attributes. © 2008 IEEE.
Original languageEnglish
Title of host publication2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
Pages1112-1115
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2008 2nd IEEE International Nanoelectronics Conference, INEC 2008 - Shanghai, China
Duration: 24 Mar 200827 Mar 2008

Conference

Conference2008 2nd IEEE International Nanoelectronics Conference, INEC 2008
PlaceChina
CityShanghai
Period24/03/0827/03/08

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