Abstract
The considerable need to enhance data and hardware security suggest one possible future for electronics where it is possible to destroy them and even make them disappear physically. This paper reports a type of destructive electronics which features fast transience from chemical dissolution on-demand triggered in an electrochemical-mechanical manner. The detailed materials, mechanics, and device construction of the destructive electronics are presented. Experiment and analysis of the triggered releasing and transience study of electronic materials, resistors and metal-oxide-semiconductor field effect transistors illustrate the key aspects of the destructive electronics. The reported destructive electronics is useful in a wide range of areas from security and defense, to medical applications. © 2017 IOP Publishing Ltd.
| Original language | English |
|---|---|
| Article number | 065010 |
| Journal | Journal of Micromechanics and Microengineering |
| Volume | 27 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 8 May 2017 |
| Externally published | Yes |
Bibliographical note
Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to <a href="mailto:[email protected]">[email protected]</a>.Funding
This work was supported by the National Science Foundation (Grant No. ECCS-1509763 and CMMI-1554499) and New Faculty Research Grants from University of Houston. JS acknowledges the supports from the National Basic Research Program (Grant No. 2015CB351901), the National Natural Science Foundation of China (Grant Nos. 11372272, 11622221 and 11621062).
Research Keywords
- destructive electronics
- dissolution
- electrochemical-mechanical
- transient electronics