Design of accelerated life test plans under progressive Type II interval censoring with random removals

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Detail(s)

Original languageEnglish
Pages (from-to)1330-1343
Journal / PublicationJournal of Statistical Computation and Simulation
Volume83
Issue number7
Publication statusPublished - Jul 2013

Abstract

This paper investigates the design of accelerated life test (ALT) plans under progressive Type II interval censoring with random removals. Units' lifetimes are assumed to follow a Weibull distribution, and the number of random removals at each inspection is assumed to follow a binomial distribution. The optimal ALT plans, which minimize the asymptotic variance of an estimated quantile at use condition, are determined. The expected duration of the test and the expected number of inspections on each stress level are calculated. A numerical study is conducted to investigate the properties of the derived ALT plans under different parameter values. For illustration purpose, a numerical example is also given. © 2013 Copyright Taylor and Francis Group, LLC.

Research Area(s)

  • accelerated life test, interval inspection, progressive Type II censoring, random removal, Weibull distribution