Design of accelerated life test plans under progressive Type II interval censoring with random removals
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Related Research Unit(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 1330-1343 |
| Journal / Publication | Journal of Statistical Computation and Simulation |
| Volume | 83 |
| Issue number | 7 |
| Publication status | Published - Jul 2013 |
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Abstract
This paper investigates the design of accelerated life test (ALT) plans under progressive Type II interval censoring with random removals. Units' lifetimes are assumed to follow a Weibull distribution, and the number of random removals at each inspection is assumed to follow a binomial distribution. The optimal ALT plans, which minimize the asymptotic variance of an estimated quantile at use condition, are determined. The expected duration of the test and the expected number of inspections on each stress level are calculated. A numerical study is conducted to investigate the properties of the derived ALT plans under different parameter values. For illustration purpose, a numerical example is also given. © 2013 Copyright Taylor and Francis Group, LLC.
Research Area(s)
- accelerated life test, interval inspection, progressive Type II censoring, random removal, Weibull distribution
Citation Format(s)
Design of accelerated life test plans under progressive Type II interval censoring with random removals. / Ding, Chang; Tse, Siu-Keung.
In: Journal of Statistical Computation and Simulation, Vol. 83, No. 7, 07.2013, p. 1330-1343.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
