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Deposition of large-area, high-quality cubic boron nitride films by ECR-enhanced microwave-plasma CVD

  • W. J. Zhang
  • , C. Y. Chan
  • , K. M. Chan
  • , I. Bello
  • , Y. Lifshitz
  • , S. T. Lee

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Large-area, 1-μm-thick cubic boron nitride (cBN) films were deposited on (001) silicon substrates by electron-cyclotron-resonance-enhanced microwave-plasma chemical vapor deposition (ECR-MP CVD) in a mixture of He-Ar-N2-BF3-H2 gases. With the assistance of fluorine chemistry in the gas phase and substrate reactions, the phase purity of the sp3 -configuration was improved to over 85% at a reduced substrate bias voltage of -40V. The grown films show clear Raman transversal optical (TO) and longitudinal optical (LO) phonon vibration modes, characteristic of cBN. Such Raman spectral characteristics are the first ever observed in cBN films prepared under ECR-MP CVD conditions.
Original languageEnglish
Pages (from-to)953-955
JournalApplied Physics A: Materials Science and Processing
Volume76
Issue number6
DOIs
Publication statusPublished - Apr 2003

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