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Dense Al2O3 films prepared by high power impulse magnetron sputtering at pulsed kV bias

  • Dongjie Yang (Co-first Author)
  • , Yaoyao Liu (Co-first Author)
  • , Xiang Zhang
  • , Shusheng Chen
  • , Xiaowei Wang
  • , Yu Liao
  • , Xiaokai An
  • , Yanfei Zhao
  • , Lingjie Chen
  • , Suihan Cui
  • , Liangliang Liu*
  • , Ricky K Y Fu
  • , Paul K Chu
  • , Zhongzhen Wu*
  • *Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

Abstract

Al2O3 films are often used in electronic and other devices for surface protection due to their excellent insulating and mechanical properties, but these properties depend on the film density. Conventional magnetron sputtering used industrially to deposit Al2O3 films faces challenges in density regulation, and many Al2O3 coatings have poor densities. Herein, negative kV biases are applied to the substrate in high-power impulse magnetron sputtering (HiPIMS) to produce the desirable high-energy ions to densify the Al2O3 films. Our results indicate that the high pulsed bias also mitigates arcing during the deposition of insulating alumina films. By increasing the pulsed voltage, the film density increases, resulting in higher optical transparency, better insulating and mechanical properties, as well as superior corrosion resistance. 

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Original languageEnglish
Article number140611
JournalThin Solid Films
Volume811
Online published21 Jan 2025
DOIs
Publication statusPublished - 1 Feb 2025

Funding

This work was financially supported by the Shenzhen Science and Technology Research Plan (Grant No. SGDX20201103095406024, KJZD20231023100304009), Sustainable Supporting Funds for Colleges and Universities in 2022 (Grant No. 20220810143642004), National Natural Science Foundation Youth Science Fund project (Grant No. 52305174), Postdoctoral Research Fund Project after Outbound of Shenzhen (Grant No. 6700200201), Shenzhen - Hong Kong Technology Cooperation Funding Scheme (TCFS) (Grant No. GHP/149/20SZ or CityU 9440296), City University of Hong Kong Internal Fund for ITF Projects (Grant No. 9678148), City University of Hong Kong Donation Research Grants (Grant Nos. DON-RMG 9229021 and 9220061), and City University of Hong Kong Strategic Research Grant (SRG) (Grant No. 7005505).

Research Keywords

  • Alumina films
  • Film density
  • High power impulse magnetron sputtering
  • Kilovolt pulsed bias

RGC Funding Information

  • RGC-funded

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