Abstract
Deformation twinning is observed upon large plastic deformation in nanocrystalline (nc) Ni by transmission electron microscopy examinations. New and compelling evidence has been obtained for several twinning mechanisms that operate in nc grains, with the grain boundary emission of partial dislocations determined as the most proficient. Deformation twinning in nc Ni is discussed in comparison with molecular dynamics simulation results, based on generalized planar fault energy curves.
| Original language | English |
|---|---|
| Title of host publication | Ultrafine Grained Materials IV |
| Editors | Yuntian T. Zhu |
| Publisher | Wiley |
| Pages | 35-40 |
| ISBN (Print) | 0873396286, 9780873396288 |
| Publication status | Published - Mar 2006 |
| Externally published | Yes |
| Event | 2006 TMS Annual Meeting: Linking Science and Technology for Global Solutions - Henry B. Gonzalez Convention Center, San Antonio, TX, United States Duration: 12 Mar 2006 → 16 Mar 2006 Conference number: 135th https://www.tms.org/Meetings/Annual-06/PDFs/AM06-Ftechprog.pdf https://www.tms.org/Meetings/Annual-06/PDFs/AM06-FTuesday.pdf |
Publication series
| Name | TMS Annual Meeting |
|---|---|
| Volume | 2006 |
Conference
| Conference | 2006 TMS Annual Meeting |
|---|---|
| Country/Territory | United States |
| City | San Antonio, TX |
| Period | 12/03/06 → 16/03/06 |
| Internet address |
Bibliographical note
Publication information for this record has been verified with the author(s) concerned.Research Keywords
- Deformation twinning
- Nanocrystalline
- Plastic deformation