Deformation banding and its influence on deformation textures formation

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

2 Scopus Citations
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Author(s)

Detail(s)

Original languageEnglish
Title of host publicationJournal De Physique
PublisherPubl by Editions de Physique
Pages2027-2032
Volume3
ISBN (print)2868832067
Publication statusPublished - Nov 1993
Externally publishedYes

Publication series

Name
Volume3
ISSN (electronic)1155-4339

Conference

TitleProceedings of the 3rd European Conference on Advanced Materials and Processes. Part 3 (of 3)
CityParis, Fr
Period8 - 10 June 1993

Abstract

It is shown by a crystallographic etching technique that deformation banding is an important deformation mode in copper. In a cold rolled coarse grain copper, deformation banding forms in a three dimensional manner dividing grains into a large number of bands of different orientations. The influence of this important, but long ignored deformation mode, is studied by incorporating it into the Taylor model. The predicted textures from the new model are better than those from other existing models in mainly two aspects. Firstly, the present model predicts the co-existence of the three major FCC rolling texture components, namely (123) or S component, (112) or C and (110) or B. The existing models are deficient in that they predict either C and S or B, but not their co-existence. The second point is that textures predicted by the existing models are always too sharp compared to the experimental textures. The deformation banding model predicts texture peaks with larger spread and hence more realistic texture sharpness.

Citation Format(s)

Deformation banding and its influence on deformation textures formation. / Lee, C. S.; Duggan, B. J.; Smallman, R. E.
Journal De Physique. Vol. 3 Publ by Editions de Physique, 1993. p. 2027-2032.

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review