Abstract
Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-Tomography data is often associated with a random image jitter, resulting from imperfections in the hardware setup. Without a proper image registration process prior to the reconstruction, the quality of the result will be compromised. Here a deep-learning-based image jitter correction method is presented, which registers the projective images with high efficiency and accuracy, facilitating a high-quality tomographic reconstruction. This development is demonstrated and validated using synthetic and experimental datasets. The method is effective and readily applicable to a broad range of applications. Together with this paper, the source code is published and adoptions and improvements from our colleagues in this field are welcomed.
| Original language | English |
|---|---|
| Pages (from-to) | 1909-1915 |
| Journal | Journal of Synchrotron Radiation |
| Volume | 28 |
| Issue number | Part 6 |
| DOIs | |
| Publication status | Published - Nov 2021 |
| Externally published | Yes |
Research Keywords
- deep learning
- full-field transmission X-ray microscopy
- image registration
- nano-Tomography
- residual neural network
- Data Science
Publisher's Copyright Statement
- This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/
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