Deep-learning-based image registration for nano-resolution tomographic reconstruction

Tianyu Fu, Kai Zhang*, Yan Wang, Jizhou Li*, Jin Zhang, Chunxia Yao, Qili He, Shanfeng Wang, Wanxia Huang, Qingxi Yuan*, Piero Pianetta, Yijin Liu

*Corresponding author for this work

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Abstract

Nano-resolution full-field transmission X-ray microscopy has been successfully applied to a wide range of research fields thanks to its capability of non-destructively reconstructing the 3D structure with high resolution. Due to constraints in the practical implementations, the nano-Tomography data is often associated with a random image jitter, resulting from imperfections in the hardware setup. Without a proper image registration process prior to the reconstruction, the quality of the result will be compromised. Here a deep-learning-based image jitter correction method is presented, which registers the projective images with high efficiency and accuracy, facilitating a high-quality tomographic reconstruction. This development is demonstrated and validated using synthetic and experimental datasets. The method is effective and readily applicable to a broad range of applications. Together with this paper, the source code is published and adoptions and improvements from our colleagues in this field are welcomed.
Original languageEnglish
Pages (from-to)1909-1915
JournalJournal of Synchrotron Radiation
Volume28
Issue numberPart 6
DOIs
Publication statusPublished - Nov 2021
Externally publishedYes

Research Keywords

  • deep learning
  • full-field transmission X-ray microscopy
  • image registration
  • nano-Tomography
  • residual neural network
  • Data Science

Publisher's Copyright Statement

  • This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/

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