Data-embedded-error-diffusion hologram

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

12 Scopus Citations
View graph of relations

Author(s)

Related Research Unit(s)

Detail(s)

Original languageEnglish
Article number060017
Journal / PublicationChinese Optics Letters
Volume12
Issue number6
Online published28 May 2014
Publication statusPublished - 10 Jun 2014

Abstract

This paper describes a method for converting a complex Fresnel hologram into a phase-only hologram that can be embedded with large amount of data. Briefly, each row of pixels in the hologram is scanned sequentially in a left-to-right direction. The magnitude of each visited pixel is set to a constant, and its phase is embedded with the data. Subsequently, the error is diffused to the neighborhood pixels. The phase hologram realized with such means, which is referred to as the data-embedded-error-diffusion (DEED) hologram, is capable of preserving high fidelity on the content of the hologram and the embedded data.

Citation Format(s)

Data-embedded-error-diffusion hologram. / Tsang, P. W. M.; Poon, T.-C.
In: Chinese Optics Letters, Vol. 12, No. 6, 060017, 10.06.2014.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review