Data Driven Neural-Based Measurement Discrimination for IC Parametric Faults Diagnosis

Angus Wu; Jack Meador

doi:10.1109/VTEST.1992.232748

Data Driven Neural-Based Measurement Discrimination for IC Parametric Faults Diagnosis

Angus Wu, Jack Meador

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

2 Citations (Scopus)

Abstract

This paper describes experimental results obtained with the use of data driven neural based system for statistical IC fault diagnosis. Measurement discrimination is established through a reduction method involving data pre-processing in a fashion consistent with a specific definition of parametric faults. The effects of this preprocessing are examined in the context of a realistic IC parametric fault diagnostic problem.

Original language	English
Title of host publication	Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992
Publisher	IEEE Computer Society
Pages	194-197
ISBN (Print)	0780306236
DOIs	https://doi.org/10.1109/VTEST.1992.232748
Publication status	Published - Apr 1992
Externally published	Yes
Event	1992 IEEE VLSI Test Symposium, VLSI 1992 - Atlantic City, United States Duration: 7 Apr 1992 → 9 Apr 1992

Conference

Conference	1992 IEEE VLSI Test Symposium, VLSI 1992
Country/Territory	United States
City	Atlantic City
Period	7/04/92 → 9/04/92

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10.1109/VTEST.1992.232748

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title = "Data Driven Neural-Based Measurement Discrimination for IC Parametric Faults Diagnosis",

abstract = "This paper describes experimental results obtained with the use of data driven neural based system for statistical IC fault diagnosis. Measurement discrimination is established through a reduction method involving data pre-processing in a fashion consistent with a specific definition of parametric faults. The effects of this preprocessing are examined in the context of a realistic IC parametric fault diagnostic problem.",

author = "Angus Wu and Jack Meador",

year = "1992",

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doi = "10.1109/VTEST.1992.232748",

language = "English",

isbn = "0780306236",

pages = "194--197",

booktitle = "Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992",

publisher = "IEEE Computer Society",

address = "United States",

note = "1992 IEEE VLSI Test Symposium, VLSI 1992 ; Conference date: 07-04-1992 Through 09-04-1992",

}

Data Driven Neural-Based Measurement Discrimination for IC Parametric Faults Diagnosis. / Wu, Angus; Meador, Jack.
Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992. IEEE Computer Society, 1992. p. 194-197 232748.

Research output: Chapters, Conference Papers, Creative and Literary Works › RGC 32 - Refereed conference paper (with host publication) › peer-review

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AU - Meador, Jack

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AB - This paper describes experimental results obtained with the use of data driven neural based system for statistical IC fault diagnosis. Measurement discrimination is established through a reduction method involving data pre-processing in a fashion consistent with a specific definition of parametric faults. The effects of this preprocessing are examined in the context of a realistic IC parametric fault diagnostic problem.

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M3 - RGC 32 - Refereed conference paper (with host publication)

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EP - 197

BT - Digest of Papers - 1992 IEEE VLSI Test Symposium, VLSI 1992

PB - IEEE Computer Society

T2 - 1992 IEEE VLSI Test Symposium, VLSI 1992

Y2 - 7 April 1992 through 9 April 1992

ER -

Data Driven Neural-Based Measurement Discrimination for IC Parametric Faults Diagnosis

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