Darlington feedback amplifier with good bias stability under large-signal conditions

T. K. Lee; W. S. Chan; Y. M. Siu

doi:10.1049/el:20045301

Author(s)

Related Research Unit(s)

Department of Electrical Engineering

Detail(s)

Original language	English
Pages (from-to)	1271-1272
Journal / Publication	Electronics Letters
Volume	40
Issue number	20
Publication status	Published - 30 Sep 2004

Link(s)

DOI	DOI https://doi.org/10.1049/el:20045301 Final Published version
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Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-6444240785&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(8bc5a16a-f672-4fb7-9071-958e0ecff150).html

Abstract

A Darlington cell using resistive biasing suffers from bias stability under large-signal conditions, which can be detrimental at radio frequencies. Replacing the resistor with a transistor in a configuration similar to a current source but acting also as an amplifier has shown a beneficial improvement.

Citation Format(s)

[ RIS ] [ BibTeX ]

Darlington feedback amplifier with good bias stability under large-signal conditions. / Lee, T. K.; Chan, W. S.; Siu, Y. M.

In: Electronics Letters, Vol. 40, No. 20, 30.09.2004, p. 1271-1272.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review

Lee, TK, Chan, WS & Siu, YM 2004, 'Darlington feedback amplifier with good bias stability under large-signal conditions', Electronics Letters, vol. 40, no. 20, pp. 1271-1272. https://doi.org/10.1049/el:20045301

Lee, T. K., Chan, W. S., & Siu, Y. M. (2004). Darlington feedback amplifier with good bias stability under large-signal conditions. Electronics Letters, 40(20), 1271-1272. https://doi.org/10.1049/el:20045301

Lee TK, Chan WS , Siu YM. Darlington feedback amplifier with good bias stability under large-signal conditions. Electronics Letters. 2004 Sep 30;40(20):1271-1272. doi: 10.1049/el:20045301

Lee, T. K. ; Chan, W. S. ; Siu, Y. M. / Darlington feedback amplifier with good bias stability under large-signal conditions. In: Electronics Letters. 2004 ; Vol. 40, No. 20. pp. 1271-1272.