Current transport and high-field reliability of aluminum/hafnium oxide/silicon structure
- Banani Sen
- , Hei Wong
- , V. Filip
- , H. Y. Choi
- , C. K. Sarkar
- , M. Chan
- , C. W. Kok
- , M. C. Poon
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
16
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(Scopus)