TY - GEN
T1 - Crystallographic and eigenmode dependence of TCf for single crystal silicon contour mode resonators
AU - Zhu, H.
AU - Shan, G. C.
AU - Tu, C.
AU - Lee, J. E Y
PY - 2013
Y1 - 2013
N2 - This paper reports the effects of crystal orientations on the temperature coefficient of frequency (TCf) of single crystal silicon square-plate micromechanical resonators vibrating in two distinct contour modes: Lamé mode and square extensional (SE). For the Lamé mode, the same TCf was found over several devices aligned to the direction, while much greater variation in the TCf was observed among the devices aligned against the direction. For the SE mode, the devices in both and orientations exhibit similar TCf values for varying doping levels. These observations are supported by Keyes' theory and close agreement between experiments and simulations is shown. © 2013 IEEE.
AB - This paper reports the effects of crystal orientations on the temperature coefficient of frequency (TCf) of single crystal silicon square-plate micromechanical resonators vibrating in two distinct contour modes: Lamé mode and square extensional (SE). For the Lamé mode, the same TCf was found over several devices aligned to the direction, while much greater variation in the TCf was observed among the devices aligned against the direction. For the SE mode, the devices in both and orientations exhibit similar TCf values for varying doping levels. These observations are supported by Keyes' theory and close agreement between experiments and simulations is shown. © 2013 IEEE.
UR - https://www.scopus.com/pages/publications/84875473560
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84875473560&origin=recordpage
U2 - 10.1109/MEMSYS.2013.6474354
DO - 10.1109/MEMSYS.2013.6474354
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 9781467356558
SP - 761
EP - 764
BT - Proceedings of the IEEE International Conference on Micro Electro Mechanical Systems (MEMS)
T2 - IEEE 26th International Conference on Micro Electro Mechanical Systems, MEMS 2013
Y2 - 20 January 2013 through 24 January 2013
ER -