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Crystal growth and characterization of Sr3TaGa 3Si2O14 single crystals

  • F. P. Yu
  • , D. R. Yuan
  • , S. J. Zhang
  • , X. Zhao
  • , S. Y. Guo
  • , X. L. Duan

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Abstract

High quality piezoelectric single crystals Sr3TaGa 3Si2O14 were grown using the conventional Czochralski method along the Y-axis. The mass density was found to be 5.121 g cm-3 by the Archimedes method. The relative dielectric constants, piezoelectric strain coefficients and elastic compliance constants of Sr 3TaGa3Si2O14 single crystals were determined by an electric bridge and the resonant-antiresonant method at room temperature. The results were , , d11 = -4.90 pC N-1, d14 = 3.20 pC N-1; ; ; ; ; ; and , respectively. The temperature dependent behaviour of elastic compliance constants was also investigated, where zero temperature compensated cuts were not found in the range from -40 to 120 °C. © 2009 IOP Publishing Ltd.
Original languageEnglish
Article number085112
JournalJournal of Physics D: Applied Physics
Volume42
Issue number8
DOIs
Publication statusPublished - 2009
Externally publishedYes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Funding

This work is supported by the National Nature Science Foundation of China (NNSFC No 60678040) and the Foundation from Technology and Industry for National Defense of China.

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