Critical Current Scaling in Long Diffusive Graphene-Based Josephson Junctions

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)LetterNot applicablepeer-review

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Author(s)

  • Chung Ting Ke
  • Anne W. Draelos
  • Francois Amet
  • Yuriy Bomze
  • Gareth Jones
  • Monica Craciun
  • Saverio Russo
  • Michihisa Yamamoto
  • Seigo Tarucha
  • Gleb Finkelstein

Detail(s)

Original languageEnglish
Pages (from-to)4788-4791
Journal / PublicationNano Letters
Volume16
Issue number8
Early online date7 Jul 2016
StatePublished - 10 Aug 2016
Externally publishedYes

Abstract

We present transport measurements on long, diffusive, graphene-based Josephson junctions. Several junctions are made on a single-domain crystal of CVD graphene and feature the same contact width of ∼9 μm but vary in length from 400 to 1000 nm. As the carrier density is tuned with the gate voltage, the critical current in these junctions ranges from a few nanoamperes up to more than 5 μA, while the Thouless energy, ETh, covers almost 2 orders of magnitude. Over much of this range, the product of the critical current and the normal resistance ICRN is found to scale linearly with ETh, as expected from theory. However, the value of the ratio ICRN/ETh is found to be 0.1-0.2, which much smaller than the predicted ∼10 for long diffusive SNS junctions.

Research Area(s)

  • diffusive SNS junction, Graphene, Josephson junction, superconductivity, Thouless energy

Citation Format(s)

Critical Current Scaling in Long Diffusive Graphene-Based Josephson Junctions. / Ke, Chung Ting; Borzenets, Ivan V.; Draelos, Anne W.; Amet, Francois; Bomze, Yuriy; Jones, Gareth; Craciun, Monica; Russo, Saverio; Yamamoto, Michihisa; Tarucha, Seigo; Finkelstein, Gleb.

In: Nano Letters, Vol. 16, No. 8, 10.08.2016, p. 4788-4791.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)LetterNot applicablepeer-review