CPF: A Cross-Layer Prefetching Framework for High-Density Flash-Based Storage

Longfei Luo, Han Wang, Dingcui Yu, Yina Lv, Liang Shi*

*Corresponding author for this work

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

2 Citations (Scopus)

Abstract

The pseudo-single-level-cell (pSLC) technique is widely adopted in high-density flash-based storage to mitigate the performance and endurance problem of high-density flash memory. Furthermore, prefetching schemes can compensate for performance differences among storage tiers. Existing prefetchers are implemented in the operating system (OS) or storage layers. However, OS layer prefetchers are conservative since it is a challenge to achieve both high accuracy and large coverage simultaneously. Storage layer prefetchers are sub-optimal due to the performance differences between pSLC and DRAM. In this paper, a cross-layer prefetching framework (CPF) is proposed to prefetch data selectively. The basic idea is that high-accuracy data will be prefetched to DRAM and large-coverage data will be prefetched to the pSLC flash in storage. To make it practical, an adaptive regulator is further designed to dynamically adjust the cross-layer prefetching to ensure accuracy and coverage. Evaluations show that CPF can improve read performance and reduce data transfer costs significantly. © 2024 EDAA.
Original languageEnglish
Title of host publication2024 Design, Automation & Test in Europe Conference & Exhibition (DATE) - Proceedings
PublisherIEEE
Number of pages6
ISBN (Electronic)9783981926385
ISBN (Print)9798350348590, 9798350348606
Publication statusPublished - 2024
Event27th Design, Automation and Test in Europe Conference (DATE 2024) - Palacio De Congresos Valencia, Valencia, Spain
Duration: 25 Mar 202427 Mar 2024
https://www.date-conference.com/

Publication series

NameProceedings -Design, Automation and Test in Europe, DATE
ISSN (Print)1530-1591
ISSN (Electronic)1558-1101

Conference

Conference27th Design, Automation and Test in Europe Conference (DATE 2024)
PlaceSpain
CityValencia
Period25/03/2427/03/24
Internet address

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