Corrigendum to "Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering" [Mater. Res. Bull. 48 (2013) 1093-1098]

Jai Singh
, X.L. Zhang
, K.S. Hui^*
, K.N. Hui^*

^*Corresponding author for this work

Research output: Journal Publications and Reviews › Erratum › peer-review

1 Citation (Scopus)

1 Scopus Citations
1 RGC 21 - Publication in refereed journal

1 results

2013
Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering
Zhang, X. L., Hui, K. N., Hui, K. S. & Singh, J., Mar 2013, In: Materials Research Bulletin. 48, 3, p. 1093-1098
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
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