Corrigendum to "Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering" [Mater. Res. Bull. 48 (2013) 1093-1098]

Jai Singh; X.L. Zhang; K.S. Hui; K.N. Hui

doi:10.1016/j.materresbull.2013.02.001

Corrigendum to "Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering" [Mater. Res. Bull. 48 (2013) 1093-1098]

Jai Singh, X.L. Zhang, K.S. Hui^*, K.N. Hui^*

^*Corresponding author for this work

Research output: Journal Publications and Reviews › Erratum › peer-review

Original language	English
Pages (from-to)	2010
Journal	Materials Research Bulletin
Volume	48
Issue number	5
DOIs	https://doi.org/10.1016/j.materresbull.2013.02.001
Publication status	Published - May 2013

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10.1016/j.materresbull.2013.02.001

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@article{defc775c4cfa4d42b7f7ace4272ce72f,

title = "Corrigendum to {"}Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering{"} [Mater. Res. Bull. 48 (2013) 1093-1098]",

author = "Jai Singh and X.L. Zhang and K.S. Hui and K.N. Hui",

year = "2013",

month = may,

doi = "10.1016/j.materresbull.2013.02.001",

language = "English",

volume = "48",

pages = "2010",

journal = "Materials Research Bulletin",

issn = "0025-5408",

publisher = "Elsevier Ltd.",

number = "5",

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TY - JOUR

T1 - Corrigendum to "Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering" [Mater. Res. Bull. 48 (2013) 1093-1098]

AU - Singh, Jai

AU - Zhang, X.L.

AU - Hui, K.S.

AU - Hui, K.N.

PY - 2013/5

Y1 - 2013/5

UR - http://www.scopus.com/inward/record.url?scp=84875217857&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-84875217857&origin=recordpage

U2 - 10.1016/j.materresbull.2013.02.001

DO - 10.1016/j.materresbull.2013.02.001

M3 - Erratum

SN - 0025-5408

VL - 48

SP - 2010

JO - Materials Research Bulletin

JF - Materials Research Bulletin

IS - 5

ER -

Corrigendum to "Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering" [Mater. Res. Bull. 48 (2013) 1093-1098]

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Structural and optical characterization of high-quality ZnO thin films deposited by reactive RF magnetron sputtering

Cite this