Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569))

Research output: Journal Publications and Reviews › Erratum

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Author(s)

Way Kuo

Detail(s)

Original language	English
Pages (from-to)	169
Journal / Publication	IEEE Transactions on Reliability
Volume	56
Issue number	1
Publication status	Published - Mar 2007
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1109/TR.2006.890224 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-34047143191&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(3c174c02-99a0-4fef-8462-bbb0009bb880).html

Citation Format(s)

[ RIS ] [ BibTeX ]

Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569)). / Kuo, Way.
In: IEEE Transactions on Reliability, Vol. 56, No. 1, 03.2007, p. 169.

Research output: Journal Publications and Reviews › Erratum

Kuo, W 2007, 'Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569))', IEEE Transactions on Reliability, vol. 56, no. 1, pp. 169. https://doi.org/10.1109/TR.2006.890224

Kuo, W. (2007). Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569)). IEEE Transactions on Reliability, 56(1), 169. https://doi.org/10.1109/TR.2006.890224

Kuo W. Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569)). IEEE Transactions on Reliability. 2007 Mar;56(1):169. doi: 10.1109/TR.2006.890224

Kuo, Way. / Corrections to “Challenges Related to Reliability in Nano Electronics” (IEEE Transactions on Reliability vol. 1 (569)). In: IEEE Transactions on Reliability. 2007 ; Vol. 56, No. 1. pp. 169.