Controllable fabrication of bent near-field optical fiber probes by electric arc heating

H. N. Lin; U. Lewlomphaisarl; S. H. Chen; L. J. Lee; Din Ping Tsai

doi:10.1063/1.1149188

Controllable fabrication of bent near-field optical fiber probes by electric arc heating

H. N. Lin
, U. Lewlomphaisarl
, S. H. Chen
, L. J. Lee
, Din Ping Tsai

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

13 Citations (Scopus)

Abstract

We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 μm were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

Original language	English
Pages (from-to)	3843-3845
Journal	Review of Scientific Instruments
Volume	69
Issue number	11
DOIs	https://doi.org/10.1063/1.1149188
Publication status	Published - Nov 1998
Externally published	Yes

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Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

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title = "Controllable fabrication of bent near-field optical fiber probes by electric arc heating",

abstract = "We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 μm were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. {\textcopyright} 1998 American Institute of Physics.",

author = "Lin, \{H. N.\} and U. Lewlomphaisarl and Chen, \{S. H.\} and Lee, \{L. J.\} and Tsai, \{Din Ping\}",

note = "Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected]. ",

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doi = "10.1063/1.1149188",

language = "English",

volume = "69",

pages = "3843--3845",

journal = "Review of Scientific Instruments",

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publisher = "American Institute of Physics",

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TY - JOUR

T1 - Controllable fabrication of bent near-field optical fiber probes by electric arc heating

AU - Lin, H. N.

AU - Lewlomphaisarl, U.

AU - Chen, S. H.

AU - Lee, L. J.

AU - Tsai, Din Ping

N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

PY - 1998/11

Y1 - 1998/11

N2 - We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 μm were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

AB - We describe the construction of a high voltage electric arc puller for controllable fabrication of bent near-field optical fiber probes. Various probes with bent angles ranging from 30° to 75° and bent lengths between 600 and 900 μm were successfully produced. The tip diameters achieved are between 100 and 200 nm. These bent type probes can be made into cantilevered probes that can be used for any dynamic mode atomic force microscope, and make the construction of a scanning near-field optical microscope easily attainable. © 1998 American Institute of Physics.

UR - https://www.scopus.com/pages/publications/0007956525

UR - https://www.scopus.com/pages/publications/0007956525#tab=impact

U2 - 10.1063/1.1149188

DO - 10.1063/1.1149188

M3 - RGC 21 - Publication in refereed journal

SN - 0034-6748

VL - 69

SP - 3843

EP - 3845

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 11

ER -

Controllable fabrication of bent near-field optical fiber probes by electric arc heating

Abstract

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