Abstract
p -type ZnO thin films have been fabricated by In and N codoping. The carrier type in the In-N codoped ZnO can be controlled by adjusting the growth conditions and good p -type conductivity is obtained at temperatures between 490 and 580 °C. The p -type behavior is improved when a buffer layer is used. The lowest reliable room temperature resistivity is found to be 7.85 cm in the presence of a buffer layer. The ZnO-based homostructural p-n junctions comprising a n-ZnO:In layer on a p-ZnO: (In,N) layer on a buffer layer display apparent electrical rectification in the authors' repeated measurements. © 2006 American Institute of Physics.
| Original language | English |
|---|---|
| Article number | 252113 |
| Journal | Applied Physics Letters |
| Volume | 89 |
| Issue number | 25 |
| DOIs | |
| Publication status | Published - 2006 |
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SDG 7 Affordable and Clean Energy
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