TY - JOUR
T1 - Contribution of H ion etching under different substrate bias to the orientation degree of diamond films
AU - Zhang, W. J.
AU - Jiang, X.
PY - 1998
Y1 - 1998
N2 - An etching process of hydrogen ions was performed during the initial growth stage of diamond films. The H+ ion etching was performed by applying a negative substrate bias during a microwave plasma chemical vapor deposition process, using only hydrogen as a reactant gas. The contribution of H+ etching under different substrate bias and for different etching time to the orientation degree of diamond films was investigated by scanning electron microscopy and atomic force microscopy. It was found that an additional H+ etching process had influence on the orientation degree of deposited (001)-oriented diamond films. To achieve a significant improvement of crystal orientation, the bias voltage and etching time should be adjusted concerning to the situation of diamond films.
AB - An etching process of hydrogen ions was performed during the initial growth stage of diamond films. The H+ ion etching was performed by applying a negative substrate bias during a microwave plasma chemical vapor deposition process, using only hydrogen as a reactant gas. The contribution of H+ etching under different substrate bias and for different etching time to the orientation degree of diamond films was investigated by scanning electron microscopy and atomic force microscopy. It was found that an additional H+ etching process had influence on the orientation degree of deposited (001)-oriented diamond films. To achieve a significant improvement of crystal orientation, the bias voltage and etching time should be adjusted concerning to the situation of diamond films.
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U2 - 10.1557/proc-513-421
DO - 10.1557/proc-513-421
M3 - RGC 22 - Publication in policy or professional journal
SN - 0272-9172
VL - 513
SP - 421
EP - 426
JO - Materials Research Society Symposium - Proceedings
JF - Materials Research Society Symposium - Proceedings
T2 - Proceedings of the 1998 MRS Spring Meeting
Y2 - 13 April 1998 through 17 April 1998
ER -