Construction of a dual mode scanning near-field optical microscope based on a tapping mode atomic force microscope
Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
Author(s)
Detail(s)
| Original language | English |
|---|---|
| Pages (from-to) | 3840-3842 |
| Journal / Publication | Review of Scientific Instruments |
| Volume | 69 |
| Issue number | 11 |
| Publication status | Published - Nov 1998 |
| Externally published | Yes |
Link(s)
Abstract
We present the modification of a commercial tapping mode atomic force microscope into a reflection and transmission dual mode scanning near-field optical microscope. In the configuration, the normal force detection unit is replaced by a shear force detection module and an interfacing circuit. The tip-sample distance control is therefore similar to tapping mode operation. Detection of the near-field signals is based on photodiodes and the lock-in technique, and the resolutions obtained for the topography and the near-field signal are around 80 and 150 nm, respectively. © 1998 American Institute of Physics.
Bibliographic Note
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Citation Format(s)
Construction of a dual mode scanning near-field optical microscope based on a tapping mode atomic force microscope. / Lin, H. N.; Chen, S. H.; Lee, L. J. et al.
In: Review of Scientific Instruments, Vol. 69, No. 11, 11.1998, p. 3840-3842.Research output: Journal Publications and Reviews (RGC: 21, 22, 62) › 21_Publication in refereed journal › peer-review
