Conducting fluorocarbon coatings for organic light-emitting diodes

S. W. Long; C. S. Lee; Y. Lifshitz; D. Q. Gao; S. T. Lee

doi:10.1063/1.1751220

Conducting fluorocarbon coatings for organic light-emitting diodes

S. W. Long, C. S. Lee, Y. Lifshitz, D. Q. Gao, S. T. Lee

Centre of Super-Diamond and Advanced Films

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

30 Citations (Scopus)

Abstract

The use of conducting fluorocarbon coatings (CF_x) as an anode buffer layer in organic light-emitting diodes (OLED) was analyzed. The chemical modification of the treated CF_x films was studied using x-ray photoelectron spectroscopy (XPS). The resistivity of poorly conducting CF _x coatings was found to be decreased from 10¹⁰ ω cm to 10⁵ ω cm by Ar ion and near UV irradiation. It was observed that UV treatment created graphitic regions leading to the higher conductivity of the CF_x layer, keeping the underlying indium tin oxide (ITO) anode intact. On the other hand, Ar ion bombardment was found to cause damage to the ITO anode that contributed to poor device performance.

Original language	English
Pages (from-to)	4032-4034
Journal	Applied Physics Letters
Volume	84
Issue number	20
DOIs	https://doi.org/10.1063/1.1751220
Publication status	Published - 17 May 2004

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@article{c437d30d8ec94d908fd0a081e4d6a4d0,

title = "Conducting fluorocarbon coatings for organic light-emitting diodes",

abstract = "The use of conducting fluorocarbon coatings (CFx) as an anode buffer layer in organic light-emitting diodes (OLED) was analyzed. The chemical modification of the treated CFx films was studied using x-ray photoelectron spectroscopy (XPS). The resistivity of poorly conducting CF x coatings was found to be decreased from 1010 ω cm to 105 ω cm by Ar ion and near UV irradiation. It was observed that UV treatment created graphitic regions leading to the higher conductivity of the CFx layer, keeping the underlying indium tin oxide (ITO) anode intact. On the other hand, Ar ion bombardment was found to cause damage to the ITO anode that contributed to poor device performance.",

author = "Long, {S. W.} and Lee, {C. S.} and Y. Lifshitz and Gao, {D. Q.} and Lee, {S. T.}",

year = "2004",

month = may,

day = "17",

doi = "10.1063/1.1751220",

language = "English",

volume = "84",

pages = "4032--4034",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "American Institute of Physics",

number = "20",

}

TY - JOUR

T1 - Conducting fluorocarbon coatings for organic light-emitting diodes

AU - Long, S. W.

AU - Lee, C. S.

AU - Lifshitz, Y.

AU - Gao, D. Q.

AU - Lee, S. T.

PY - 2004/5/17

Y1 - 2004/5/17

N2 - The use of conducting fluorocarbon coatings (CFx) as an anode buffer layer in organic light-emitting diodes (OLED) was analyzed. The chemical modification of the treated CFx films was studied using x-ray photoelectron spectroscopy (XPS). The resistivity of poorly conducting CF x coatings was found to be decreased from 1010 ω cm to 105 ω cm by Ar ion and near UV irradiation. It was observed that UV treatment created graphitic regions leading to the higher conductivity of the CFx layer, keeping the underlying indium tin oxide (ITO) anode intact. On the other hand, Ar ion bombardment was found to cause damage to the ITO anode that contributed to poor device performance.

AB - The use of conducting fluorocarbon coatings (CFx) as an anode buffer layer in organic light-emitting diodes (OLED) was analyzed. The chemical modification of the treated CFx films was studied using x-ray photoelectron spectroscopy (XPS). The resistivity of poorly conducting CF x coatings was found to be decreased from 1010 ω cm to 105 ω cm by Ar ion and near UV irradiation. It was observed that UV treatment created graphitic regions leading to the higher conductivity of the CFx layer, keeping the underlying indium tin oxide (ITO) anode intact. On the other hand, Ar ion bombardment was found to cause damage to the ITO anode that contributed to poor device performance.

UR - http://www.scopus.com/inward/record.url?scp=2942648680&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-2942648680&origin=recordpage

U2 - 10.1063/1.1751220

DO - 10.1063/1.1751220

M3 - RGC 21 - Publication in refereed journal

SN - 0003-6951

VL - 84

SP - 4032

EP - 4034

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 20

ER -

Conducting fluorocarbon coatings for organic light-emitting diodes

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