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Concurrent Projection to Latent Structures for Output-relevant and Input-relevant Fault Monitoring

S. Joe Qin, Yingying Zheng

Research output: Chapters, Conference Papers, Creative and Literary WorksRGC 32 - Refereed conference paper (with host publication)peer-review

Abstract

When process faults occur, the process condition changes which is reflected in process variables. If these ab-normal variations are not properly annihilated in the process, poor product quality occurs as a consequence. This paper proposes a new concurrent projection to latent structures for the monitoring of output-relevant faults that affect the quality and input-relevant process faults that should be alarmed as well. The input and output data spaces are concurrently projected to five subspaces, a joint input-output subspace that captures covariations between input and output, an output-principal subspace, an output-residual subspace, an input-principal subspace, and an input-residual subspace. Process fault detection indices are developed based on the partition of subspaces for various types of fault detection alarms. The proposed monitoring method offers complete monitoring of faults that happen in the predictable output subspace and the unpredictable output residual subspace, as well as faults that affect the input spaces and could be incipient for the output. Numerical simulation examples are given to illustrate the effectiveness of the proposed methods. © 2012 IEEE.
Original languageEnglish
Title of host publication51st IEEE Conference on Decision and Control
Subtitle of host publicationFinal Program and Book of Abstracts
PublisherIEEE
Pages7018-7023
ISBN (Electronic)978-1-4673-2066-5
ISBN (Print)978-1-4673-2065-8
DOIs
Publication statusPublished - Dec 2012
Externally publishedYes
Event51st IEEE Conference on Decision and Control, CDC 2012 - Maui, HI, United States
Duration: 10 Dec 201213 Dec 2012

Publication series

NameProceedings of the IEEE Conference on Decision and Control
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISSN (Print)0191-2216

Conference

Conference51st IEEE Conference on Decision and Control, CDC 2012
PlaceUnited States
CityMaui, HI
Period10/12/1213/12/12

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