Compatibility and simplicity: The fundamentals of reliability

Way Kuo

doi:10.1109/TR.2007.912002

Compatibility and simplicity: The fundamentals of reliability

Research output: Journal Publications and Reviews › Editorial Preface

Original language	English
Pages (from-to)	585-586
Journal	IEEE Transactions on Reliability
Volume	56
Issue number	4
DOIs	https://doi.org/10.1109/TR.2007.912002
Publication status	Published - Dec 2007
Externally published	Yes

Research Keywords

Compatibility
Dependability

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10.1109/TR.2007.912002

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@article{c945a12218fe497ebbb7bcb48ee01f75,

title = "Compatibility and simplicity: The fundamentals of reliability",

keywords = "Compatibility, Dependability",

author = "Way Kuo",

year = "2007",

month = dec,

doi = "10.1109/TR.2007.912002",

language = "English",

volume = "56",

pages = "585--586",

journal = "IEEE Transactions on Reliability",

issn = "0018-9529",

publisher = "IEEE",

number = "4",

}

TY - JOUR

T1 - Compatibility and simplicity

T2 - The fundamentals of reliability

AU - Kuo, Way

PY - 2007/12

Y1 - 2007/12

KW - Compatibility

KW - Dependability

UR - http://www.scopus.com/inward/record.url?scp=36949000464&partnerID=8YFLogxK

UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-36949000464&origin=recordpage

U2 - 10.1109/TR.2007.912002

DO - 10.1109/TR.2007.912002

M3 - Editorial Preface

SN - 0018-9529

VL - 56

SP - 585

EP - 586

JO - IEEE Transactions on Reliability

JF - IEEE Transactions on Reliability

IS - 4

ER -

Compatibility and simplicity: The fundamentals of reliability

Research Keywords

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