Abstract
Full title: Comparison of face verification results on the XM2VTS database. © 2000 IEEE. no abstract available.
| Original language | English |
|---|---|
| Pages (from-to) | 858-861 |
| Journal | Proceedings - International Conference on Pattern Recognition |
| Volume | 15 |
| Issue number | 4 |
| DOIs | |
| Publication status | Published - 2000 |
| Externally published | Yes |
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