Abstract
Instrumental limitations such as bulkiness and high cost prevent the fluorescence technique from becoming ubiquitous for point-of-care deoxyribonucleic acid (DNA) detection and other in-field molecular diagnostics applications. The complimentary metal-oxide-semiconductor (CMOS) technology, as benefited from process scaling, provides several advanced capabilities such as high integration density, high-resolution signal processing, and low power consumption, enabling sensitive, integrated, and low-cost fluorescence analytical platforms. In this paper, CMOS time-resolved, contact, and multispectral imaging are reviewed. Recently reported CMOS fluorescence analysis microsystem prototypes are surveyed to highlight the present state of the art.
| Original language | English |
|---|---|
| Pages (from-to) | 20602-20619 |
| Journal | Sensors (Switzerland) |
| Volume | 14 |
| Issue number | 11 |
| DOIs | |
| Publication status | Published - 31 Oct 2014 |
Research Keywords
- CMOS
- Contact imaging
- DNA analysis
- Fluorescence spectroscopy
Publisher's Copyright Statement
- This full text is made available under CC-BY 4.0. https://creativecommons.org/licenses/by/4.0/