Chemical structure modification of silicone surfaces by plasma immersion ion implantation

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)22_Publication in policy or professional journal

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Detail(s)

Original languageEnglish
Pages (from-to)1883-1885
Journal / PublicationJournal of Materials Science Letters
Volume19
Issue number21
Publication statusPublished - Nov 2000

Abstract

The effect of modification of the chemical structure of silicone surfaces by Ar plasma immersion ion implantation (PIII) was investigated. The chemical composition and the nature of the chemical bonds were determined by the attenuated total reflectance Fourier transform infrared spectroscopy (FTIR-ATR) and by X-ray photoelectron spectroscopy (XPS) analysis. The bands in the FTIR spectrum of the PIII modified surface showed a decrease in their intensity. The XPS and the FTIR-ATR measurements suggested the formation of a ceramic-like layer on the Ar PIII-treated silicone surface.