TY - GEN
T1 - Characterizing Nanomaterial Photoelectric Properties using Two Photon Laser Scanning Microscopy
AU - Chen, Liangliang
AU - Shen, Wei
AU - Hou, Chaojian
AU - Xi, Ning
AU - Song, Bo
AU - Yang, Yongliang
AU - Wei, Lai
AU - Dong, Lixin
PY - 2016/11/21
Y1 - 2016/11/21
N2 - Nano-optoelectronic sensors and devices bring tremendous revolutions in photoelectric conversion due to dimension reduced. The device geometry dominates the electron transport so that the spatially resolved optoelectronics properties are critical to characterize device performance. In this paper, it reports a two-photon pulsed laser scanning microscopy method which utilizes raster scan on device with two coherent light beams. By measuring the light induced photon absorption, it reflects the light matter interaction on single or two combined photon. The experimental results have shown that the photon absorption are dependent on surface defect, geometry shape and internal layers in nanoscale optoelectronic devices. The proposed method will not only spatially measure where optical absorption happens but also reveal what phenomenon is exactly generated at sub-micro scale.
AB - Nano-optoelectronic sensors and devices bring tremendous revolutions in photoelectric conversion due to dimension reduced. The device geometry dominates the electron transport so that the spatially resolved optoelectronics properties are critical to characterize device performance. In this paper, it reports a two-photon pulsed laser scanning microscopy method which utilizes raster scan on device with two coherent light beams. By measuring the light induced photon absorption, it reflects the light matter interaction on single or two combined photon. The experimental results have shown that the photon absorption are dependent on surface defect, geometry shape and internal layers in nanoscale optoelectronic devices. The proposed method will not only spatially measure where optical absorption happens but also reveal what phenomenon is exactly generated at sub-micro scale.
UR - https://www.scopus.com/pages/publications/85006961127
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-85006961127&origin=recordpage
U2 - 10.1109/NANO.2016.7751515
DO - 10.1109/NANO.2016.7751515
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 9781509014941
T3 - 16th International Conference on Nanotechnology - IEEE NANO 2016
SP - 408
EP - 411
BT - 16th International Conference on Nanotechnology - IEEE NANO 2016
PB - IEEE
T2 - 16th IEEE International Conference on Nanotechnology - IEEE NANO 2016
Y2 - 22 August 2016 through 25 August 2016
ER -