Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review
Author(s)
Detail(s)
Original language | English |
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Pages (from-to) | 229-234 |
Journal / Publication | Materials Science Forum |
Volume | 414-415 |
Online published | Jan 2003 |
Publication status | Published - 2003 |
Externally published | Yes |
Conference
Title | 3rd Hungarian Conference on Materials Science, Testing and Informatics |
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Place | Hungary |
City | Balatonfured |
Period | 14 - 17 October 2001 |
Link(s)
Abstract
Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and σ=0.49, respectively. The dislocation slip system population was found to be 75% 〈a〉 type, 20% 〈c〉 type and 5% 〈c+a〉 type.
Research Area(s)
- Crystallite size distribution, Dislocation structure, Plastic deformation, Titanium, X-ray peak profile analysis
Citation Format(s)
Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis. / Gubicza, Jenő ; Dragomir, Iulianna C.; Ribárik, Gábor et al.
In: Materials Science Forum, Vol. 414-415, 2003, p. 229-234.
In: Materials Science Forum, Vol. 414-415, 2003, p. 229-234.
Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review