Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

20 Scopus Citations
View graph of relations

Author(s)

  • Jenő Gubicza
  • Iulianna C. Dragomir
  • Gábor Ribárik
  • Ruslan Valiev
  • Tamás Ungár

Detail(s)

Original languageEnglish
Pages (from-to)229-234
Journal / PublicationMaterials Science Forum
Volume414-415
Online publishedJan 2003
Publication statusPublished - 2003
Externally publishedYes

Conference

Title3rd Hungarian Conference on Materials Science, Testing and Informatics
PlaceHungary
CityBalatonfured
Period14 - 17 October 2001

Abstract

Nanocrystalline titanium was produced by equal channel angular pressing (ECAP). It was found that during ECAP a texture evolved in the specimen in which the hexagonal "c" axis is perpendicular to the extrusion direction. The crystallite size distribution and the dislocation structure were determined by fitting ab-initio theoretical functions to the Fourier coefficients of the measured X-ray diffraction peak profiles. The peak profile analysis provided the median and the variance of the crystallite size distribution: m=38 nm and σ=0.49, respectively. The dislocation slip system population was found to be 75% 〈a〉 type, 20% 〈c〉 type and 5% 〈c+a〉 type.

Research Area(s)

  • Crystallite size distribution, Dislocation structure, Plastic deformation, Titanium, X-ray peak profile analysis

Citation Format(s)

Characterization of the Microstructure of Severely Deformed Titanium by X-Ray Diffraction Profile Analysis. / Gubicza, Jenő ; Dragomir, Iulianna C.; Ribárik, Gábor et al.
In: Materials Science Forum, Vol. 414-415, 2003, p. 229-234.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review