Characterization of strained InGaAs single quantum well structures by ion beam methods

Kin Man Yu; K. T. Chan

doi:10.1063/1.102642

Author(s)

Kin Man Yu
K. T. Chan

Detail(s)

Original language	English
Pages (from-to)	45-47
Journal / Publication	Applied Physics Letters
Volume	56
Issue number	1
Publication status	Published - 1990
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1063/1.102642 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-36549101910&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(128bea99-a247-4479-bc7e-41fac2a4e7df).html

Abstract

We have investigated strained InGaAs single quantum well structures using MeV ion beam methods. The structural properties of these structures, including composition and well size, have been studied. It has been found that the composition obtained by Rutherford backscattering spectrometry and particle-induced x-ray emission techniques agrees very well with that obtained by the ion channeling method.

Citation Format(s)

[ RIS ] [ BibTeX ]

Characterization of strained InGaAs single quantum well structures by ion beam methods. / Yu, Kin Man; Chan, K. T.
In: Applied Physics Letters, Vol. 56, No. 1, 1990, p. 45-47.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Yu, KM & Chan, KT 1990, 'Characterization of strained InGaAs single quantum well structures by ion beam methods', Applied Physics Letters, vol. 56, no. 1, pp. 45-47. https://doi.org/10.1063/1.102642

Yu, K. M., & Chan, K. T. (1990). Characterization of strained InGaAs single quantum well structures by ion beam methods. Applied Physics Letters, 56(1), 45-47. https://doi.org/10.1063/1.102642

Yu KM, Chan KT. Characterization of strained InGaAs single quantum well structures by ion beam methods. Applied Physics Letters. 1990;56(1):45-47. doi: 10.1063/1.102642

Yu, Kin Man ; Chan, K. T. / Characterization of strained InGaAs single quantum well structures by ion beam methods. In: Applied Physics Letters. 1990 ; Vol. 56, No. 1. pp. 45-47.