Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy

Chia Min Chang; Yen Ju Liu; Ming Lun Tseng; Nien-Nan Chu; Ding-Wei Huang; Masud Mansuripur; Din Ping Tsai

doi:10.1002/pssb.201200356

Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy

Chia Min Chang
, Yen Ju Liu
, Ming Lun Tseng
, Nien-Nan Chu
, Ding-Wei Huang
, Masud Mansuripur
, Din Ping Tsai

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

4 Citations (Scopus)

Abstract

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Original language	English
Pages (from-to)	1945-1950
Journal	Physica Status Solidi (B) Basic Research
Volume	249
Issue number	10
DOIs	https://doi.org/10.1002/pssb.201200356
Publication status	Published - Oct 2012
Externally published	Yes

Bibliographical note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Research Keywords

Electronic data storage
Materials and process characterization
Optical recording
Phase-change materials

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Cite this

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abstract = "Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film. {\textcopyright} 2012 WILEY-VCH Verlag GmbH \& Co. KGaA, Weinheim.",

keywords = "Electronic data storage, Materials and process characterization, Optical recording, Phase-change materials",

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AU - Chang, Chia Min

AU - Liu, Yen Ju

AU - Tseng, Ming Lun

AU - Chu, Nien-Nan

AU - Huang, Ding-Wei

AU - Mansuripur, Masud

AU - Tsai, Din Ping

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AB - Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

KW - Electronic data storage

KW - Materials and process characterization

KW - Optical recording

KW - Phase-change materials

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DO - 10.1002/pssb.201200356

M3 - RGC 21 - Publication in refereed journal

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JO - Physica Status Solidi (B) Basic Research

JF - Physica Status Solidi (B) Basic Research

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