Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

3 Scopus Citations
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Author(s)

  • Chia Min Chang
  • Yen Ju Liu
  • Ming Lun Tseng
  • Nien-Nan Chu
  • Ding-Wei Huang
  • Masud Mansuripur

Detail(s)

Original languageEnglish
Pages (from-to)1945-1950
Journal / PublicationPhysica Status Solidi (B) Basic Research
Volume249
Issue number10
Publication statusPublished - Oct 2012
Externally publishedYes

Abstract

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge<sub>2</sub>Sb<sub>2</sub>Te<sub>5</sub> film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Research Area(s)

  • Electronic data storage, Materials and process characterization, Optical recording, Phase-change materials

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to lbscholars@cityu.edu.hk.

Citation Format(s)

Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy. / Chang, Chia Min; Liu, Yen Ju; Tseng, Ming Lun et al.
In: Physica Status Solidi (B) Basic Research, Vol. 249, No. 10, 10.2012, p. 1945-1950.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review