Characterization of Ge2Sb2Te5 thin film alloys using conductive-tip atomic force microscopy

Chia Min Chang; Yen Ju Liu; Ming Lun Tseng; Nien-Nan Chu; Ding-Wei Huang; Masud Mansuripur; Din Ping Tsai

doi:10.1002/pssb.201200356

Author(s)

Chia Min Chang
Yen Ju Liu
Ming Lun Tseng
Nien-Nan Chu
Ding-Wei Huang
Masud Mansuripur

Detail(s)

Original language	English
Pages (from-to)	1945-1950
Journal / Publication	Physica Status Solidi (B) Basic Research
Volume	249
Issue number	10
Publication status	Published - Oct 2012
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1002/pssb.201200356 Final Published version
	Check@CityULib
Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84867225481&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(bd1b603c-8399-4529-a828-525430754e2b).html

Abstract

Conductive-tip atomic force microscopy (C-AFM) is a powerful tool for investigating the electrical characteristics of phase-change materials commonly used for electronic and optical data storage. We demonstrate the usefulness of this technique by examining the electrical conductivity of crystalline marks recorded with a focused laser pulse on a thin Ge2Sb2Te5 film. © 2012 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

Research Area(s)

Electronic data storage, Materials and process characterization, Optical recording, Phase-change materials

Bibliographic Note

Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].

Citation Format(s)

[ RIS ] [ BibTeX ]

Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy. / Chang, Chia Min; Liu, Yen Ju; Tseng, Ming Lun et al.
In: Physica Status Solidi (B) Basic Research, Vol. 249, No. 10, 10.2012, p. 1945-1950.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Chang, CM, Liu, YJ, Tseng, ML, Chu, N-N, Huang, D-W, Mansuripur, M & Tsai, DP 2012, 'Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy', Physica Status Solidi (B) Basic Research, vol. 249, no. 10, pp. 1945-1950. https://doi.org/10.1002/pssb.201200356

Chang, C. M., Liu, Y. J., Tseng, M. L., Chu, N.-N., Huang, D.-W., Mansuripur, M., & Tsai, D. P. (2012). Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy. Physica Status Solidi (B) Basic Research, 249(10), 1945-1950. https://doi.org/10.1002/pssb.201200356

Chang CM, Liu YJ, Tseng ML, Chu NN, Huang DW, Mansuripur M et al. Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy. Physica Status Solidi (B) Basic Research. 2012 Oct;249(10):1945-1950. doi: 10.1002/pssb.201200356

Chang, Chia Min ; Liu, Yen Ju ; Tseng, Ming Lun et al. / Characterization of Ge₂Sb₂Te₅ thin film alloys using conductive-tip atomic force microscopy. In: Physica Status Solidi (B) Basic Research. 2012 ; Vol. 249, No. 10. pp. 1945-1950.