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Characterization of dislocations and sub-grain boundaries in mixed rare earth orthovanadate of Yb: YxLu1-xVO4

  • Degao Zhong*
  • , Bing Teng
  • , Lifeng Cao
  • , You Fei
  • , Shiming Zhang
  • , Yuyi Li
  • , Chao Wang
  • , Linxiang He
  • , Wanxia Huang
  • *Corresponding author for this work

    Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

    Abstract

    Mixed crystal of Yb:YxLu1xVO4 was grown by Czochralski method. Defects of dislocations and sub-grain boundaries in Yb:Y0.71Lu0.29VO4 single crystal were studied by using chemical etching and synchrotron X-ray topographic methods. Some of the three intersecting boundaries were revealed by chemical etching method in Yb:Y0.71Lu0.29VO4 crystal. The generalized Read–Shockley formula for intersecting boundaries was introduced to verify the one-to-one correspondence between etching pits along these sub-boundaries and edge dislocations with Burgers vectors of 〈1 0 0〉. Synchrotron X-ray topographic confirmed that the dominating imperfections in the studied Yb:Y0.71Lu0.29VO4 single crystal are a variously developed block structure and sub-grain boundaries.

    Original languageEnglish
    Pages (from-to)2034-2038
    JournalOptical Materials
    Volume36
    Issue number12
    Online published11 Jan 2014
    DOIs
    Publication statusPublished - Oct 2014
    Event6th International Symposium on Laser, Scintillator and Non Linear Optical Materials (ISLNOM-6) - Shanghai, China
    Duration: 21 Oct 201323 Oct 2013
    http://scschina.sic.cas.cn/English/News/201403/t20140313_163865.html

    Research Keywords

    • Rare earth orthovanadate
    • White-beam synchrotron radiation topography
    • Defects
    • Chemical etching
    • WAVE LASER OPERATION
    • DEFECT STRUCTURE
    • YTTRIUM ORTHOVANADATE
    • YVO4 CRYSTALS
    • GROWTH
    • PERFORMANCE
    • ENHANCEMENT
    • YB-LUVO4
    • DIODE

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