Abstract
Mixed crystal of Yb:YxLu1−xVO4 was grown by Czochralski method. Defects of dislocations and sub-grain boundaries in Yb:Y0.71Lu0.29VO4 single crystal were studied by using chemical etching and synchrotron X-ray topographic methods. Some of the three intersecting boundaries were revealed by chemical etching method in Yb:Y0.71Lu0.29VO4 crystal. The generalized Read–Shockley formula for intersecting boundaries was introduced to verify the one-to-one correspondence between etching pits along these sub-boundaries and edge dislocations with Burgers vectors of 〈1 0 0〉. Synchrotron X-ray topographic confirmed that the dominating imperfections in the studied Yb:Y0.71Lu0.29VO4 single crystal are a variously developed block structure and sub-grain boundaries.
| Original language | English |
|---|---|
| Pages (from-to) | 2034-2038 |
| Journal | Optical Materials |
| Volume | 36 |
| Issue number | 12 |
| Online published | 11 Jan 2014 |
| DOIs | |
| Publication status | Published - Oct 2014 |
| Event | 6th International Symposium on Laser, Scintillator and Non Linear Optical Materials (ISLNOM-6) - Shanghai, China Duration: 21 Oct 2013 → 23 Oct 2013 http://scschina.sic.cas.cn/English/News/201403/t20140313_163865.html |
Research Keywords
- Rare earth orthovanadate
- White-beam synchrotron radiation topography
- Defects
- Chemical etching
- WAVE LASER OPERATION
- DEFECT STRUCTURE
- YTTRIUM ORTHOVANADATE
- YVO4 CRYSTALS
- GROWTH
- PERFORMANCE
- ENHANCEMENT
- YB-LUVO4
- DIODE
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