TY - GEN
T1 - Characterization of dielectric properties for PZN-PMN- PT ferroelectric thin films at microwave frequencies
AU - Wong, H. M.
AU - Luo, B.
AU - Ong, L. C.
AU - Yao, K.
AU - Guo, Y. X.
N1 - Publication details (e.g. title, author(s), publication statuses and dates) are captured on an “AS IS” and “AS AVAILABLE” basis at the time of record harvesting from the data source. Suggestions for further amendments or supplementary information can be sent to [email protected].
PY - 2006
Y1 - 2006
N2 - Dielectric properties of pseudo-epitaxial perovskite ferroelectric PZN-PMN-PT thin films deposited on Lanthanum Aluminate (LAO) substrates were characterized for microwave application. Dielectric constant, voltage tunability, and loss tangent of the thin films were determined via coplanar waveguides (CPWs) and interdigital capacitors (IDCs) structures. Scattering parameters were extracted through measurements for both structures and the dielectric properties were obtained by the conformal mapping method (CMM) and partial capacitance techniques (PCT). A tunability of between 0.5% to 3% at 25V was obtained at 30MHz to 3GHz. Copyright 2006 IEICE.
AB - Dielectric properties of pseudo-epitaxial perovskite ferroelectric PZN-PMN-PT thin films deposited on Lanthanum Aluminate (LAO) substrates were characterized for microwave application. Dielectric constant, voltage tunability, and loss tangent of the thin films were determined via coplanar waveguides (CPWs) and interdigital capacitors (IDCs) structures. Scattering parameters were extracted through measurements for both structures and the dielectric properties were obtained by the conformal mapping method (CMM) and partial capacitance techniques (PCT). A tunability of between 0.5% to 3% at 25V was obtained at 30MHz to 3GHz. Copyright 2006 IEICE.
KW - Coplanar waveguides
KW - Dielectric constant
KW - Ferroelectric thin films
KW - Interdigital capacitors
KW - Loss tangent
KW - Partial capacitance technique
KW - Voltage tunability
UR - https://www.scopus.com/pages/publications/44749095120
UR - https://www.scopus.com/record/pubmetrics.uri?eid=2-s2.0-44749095120&origin=recordpage
U2 - 10.1109/APMC.2006.4429492
DO - 10.1109/APMC.2006.4429492
M3 - RGC 32 - Refereed conference paper (with host publication)
SN - 4902339080
SN - 9784902339086
VL - 1
T3 - Asia-Pacific Microwave Conference Proceedings, APMC
SP - 579
EP - 582
BT - 2006 Asia-Pacific Microwave Conference Proceedings, APMC
T2 - 2006 Asia-Pacific Microwave Conference, APMC
Y2 - 12 December 2006 through 15 December 2006
ER -