Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

R. Himmelhuber; S. S. Mehravar; O. D. Herrera; V. Demir; K. Kieu; J. Luo; A. K Y Jen; R. A. Norwood; N. Peyghambarian

doi:10.1063/1.4872165

Author(s)

R. Himmelhuber
S. S. Mehravar
O. D. Herrera
V. Demir
K. Kieu
R. A. Norwood
N. Peyghambarian

Detail(s)

Original language	English
Article number	161109
Journal / Publication	Applied Physics Letters
Volume	104
Issue number	16
Publication status	Published - 21 Apr 2014
Externally published	Yes

Link(s)

DOI	DOI https://doi.org/10.1063/1.4872165 Final Published version
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Link to Scopus	https://www.scopus.com/record/display.uri?eid=2-s2.0-84900312408&origin=recordpage
Permanent Link	https://scholars.cityu.edu.hk/en/publications/publication(6410cb60-4af4-4fc6-aa21-583b69fefea4).html

Abstract

We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r ₃₃) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from V_π measurements) were used to validate the correlation between the second-harmonic signal and r ₃₃. This also allowed us to locally map the r₃₃ coefficient in the poled area. © 2014 AIP Publishing LLC.

Citation Format(s)

[ RIS ] [ BibTeX ]

Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy. / Himmelhuber, R.; Mehravar, S. S.; Herrera, O. D. et al.
In: Applied Physics Letters, Vol. 104, No. 16, 161109, 21.04.2014.

Research output: Journal Publications and Reviews › RGC 21 - Publication in refereed journal › peer-review

Himmelhuber, R, Mehravar, SS, Herrera, OD, Demir, V, Kieu, K, Luo, J , Jen, AKY, Norwood, RA & Peyghambarian, N 2014, 'Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy', Applied Physics Letters, vol. 104, no. 16, 161109. https://doi.org/10.1063/1.4872165

Himmelhuber, R., Mehravar, S. S., Herrera, O. D., Demir, V., Kieu, K., Luo, J., Jen, A. K. Y., Norwood, R. A., & Peyghambarian, N. (2014). Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy. Applied Physics Letters, 104(16), Article 161109. https://doi.org/10.1063/1.4872165

Himmelhuber R, Mehravar SS, Herrera OD, Demir V, Kieu K, Luo J et al. Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy. Applied Physics Letters. 2014 Apr 21;104(16):161109. doi: 10.1063/1.4872165

Himmelhuber, R. ; Mehravar, S. S. ; Herrera, O. D. et al. / Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy. In: Applied Physics Letters. 2014 ; Vol. 104, No. 16.