Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review

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Author(s)

  • R. Himmelhuber
  • S. S. Mehravar
  • O. D. Herrera
  • V. Demir
  • K. Kieu
  • R. A. Norwood
  • N. Peyghambarian

Detail(s)

Original languageEnglish
Article number161109
Journal / PublicationApplied Physics Letters
Volume104
Issue number16
Publication statusPublished - 21 Apr 2014
Externally publishedYes

Abstract

We imaged coplanar poled electro optic (EO) polymer films on transparent substrates with a multiple-photon microscope in reflection and correlated the second-harmonic light intensity with the results of Pockels coefficient (r 33) measurements. This allowed us to make quantitative measurements of poled polymer films on non-transparent substrates like silicon, which are not accessible with traditional Pockels coefficient measurement techniques. Phase modulators consisting of silicon waveguide devices with EO polymer claddings with a known Pockels coefficient (from Vπ measurements) were used to validate the correlation between the second-harmonic signal and r 33. This also allowed us to locally map the r33 coefficient in the poled area. © 2014 AIP Publishing LLC.

Citation Format(s)

Characterization of coplanar poled electro optic polymer films for Si-photonic devices with multiphoton microscopy. / Himmelhuber, R.; Mehravar, S. S.; Herrera, O. D.; Demir, V.; Kieu, K.; Luo, J.; Jen, A. K Y; Norwood, R. A.; Peyghambarian, N.

In: Applied Physics Letters, Vol. 104, No. 16, 161109, 21.04.2014.

Research output: Journal Publications and Reviews (RGC: 21, 22, 62)21_Publication in refereed journalpeer-review