Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review

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Author(s)

  • M. Boselli
  • W. Liu
  • A. Fête
  • S. Gariglio
  • J.-M. Triscone

Detail(s)

Original languageEnglish
Article number061604
Journal / PublicationApplied Physics Letters
Volume108
Issue number6
Online published11 Feb 2016
Publication statusPublished - Feb 2016
Externally publishedYes

Abstract

The realization of conducting nanostructures at the interface between LaAlO3 and SrTiO3 is an important step towards the realization of devices and the investigation of exotic physical regimes. We present here a detailed study of the conducting nanowires realized using the atomic force microscopy writing technique. By comparing experiments with numerical simulations, we show that these wires reproduce the ideal case of nanoconducting channels defined in an insulating background very well and that the tip bias is a powerful knob to modulate the size of these structures. We also discuss the role of the air humidity that is found to be a crucial parameter to set the size of the tip-sample effective interaction area.

Citation Format(s)

Characterization of atomic force microscopy written conducting nanowires at LaAlO3/SrTiO3 interfaces. / Boselli, M.; Li, D.; Liu, W. et al.
In: Applied Physics Letters, Vol. 108, No. 6, 061604, 02.2016.

Research output: Journal Publications and ReviewsRGC 21 - Publication in refereed journalpeer-review